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MRC | Criteria | Characteristic |
---|---|---|
CZEQ | Time Rating Per Chacteristic | 60.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT |
CZER | Memory Device Type | ROM |
ADAT | Body Width | 0.220 INCHES MINIMUM AND 0.310 INCHES MAXIMUM |
CQZP | Input Circuit Pattern | 6 INPUT |
TEST | Test Data Document | 15786-305302 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWING) |
CQSJ | Inclosure Material | CERAMIC AND GLASS |
TTQY | Terminal Type And Quantity | 16 PRINTED CIRCUIT |
CWSG | Terminal Surface Treatment | SOLDER |
CBBL | Features Provided | HERMETICALLY SEALED AND MONOLITHIC AND POSITIVE OUTPUTS AND W/STORAGE AND PROGRAMMABLE AND PROGRAMMED AND 3-STATE OUTPUT AND W/ENABLE AND W/BUFFERED OUTPUT AND W/DECODED OUTPUT AND BIPOLAR |
AFGA | Operating Temp Range | -55.0/+125.0 DEG CELSIUS |
ADAQ | Body Length | 0.870 INCHES MAXIMUM |
ADAU | Body Height | 0.120 INCHES MINIMUM AND 0.185 INCHES MAXIMUM |
AGAV | End Item Identification | TRAINER,SIMULATOR,ELECTRONIC WARFARE,TYPE AN/ALQ-T4 |
CQSZ | Inclosure Configuration | DUAL-IN-LINE |
AFJQ | Storage Temp Range | -65.0/+150.0 DEG CELSIUS |
CZEN | Voltage Rating And Type Per Characteristic | 5.5 VOLTS MAXIMUM POWER SOURCE |
MRC | Decoded Requirement | Clear Text Reply |
CQWX | Output Logic Form | TRANSISTOR-TRANSISTOR LOGIC |
CZZZ | Memory Capacity | UNKNOWN |
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